With more and more mature technology for mini- and microLED fabrication, manufacturers are gearing up for the production phase and critically looking for more test efficiency and fast testing for the optical devices.
Star Technologies, a major mini- and microLED tester supplier, continually develop measurement technology to enhance optical testing capabilities and parallel test efficiency and to achieve fast, affordable production.
Star’s new Unicorn-LAIT II tester, based on an integrated parallel test architecture, is designed to meet diverse industry requirements and to ensure accurate and reliable measurement results in the shortest test time. The tester is ideal for electrical and optical measurement; driver functionality; RGB testing, and more. It is equipped with a highly efficient light- and EMI-shielded test environment dedicated to LED and laser applications. The system can be upgraded with an autoloader for a fully automatic test with a cassette.
Star’s Unicorn mini- and microLED tester is based on a flexible architecture platform supporting small pads probing with controlled needle force. The tester integrates parallel testing with a probe station and card, and offers comprehensive analysis results. It efficiently accomplishes manufacturers’ expectations for high throughput production to meet their customer’s assembly requirements.
“Test time and the reliable result are the key factors for product strategy. Unicorn-LAIT II is a high throughput tester to cater for dies in hundreds of thousands to millions of optical devices per wafer and allows industry users to significantly reduce the cost of testing”, said Star CEO and CTO Dr. Choon Leong Lou.
