There’s an all-new system from Hamamatsu Photonics for high-speed inspection of microLEDs on wafers. Called the MiNY PL, the tool is designed to detect abnormalities in the LEDs’ external appearance, intensity, and wavelength of their light emissions. The MiNY PL system uses a photoluminescence (PL) measurement technique based on the company’s image processing technology and…
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