Hamamatsu’s Rapid MicroLED Inspection Tool

There’s an all-new system from Hamamatsu Photonics for high-speed inspection of microLEDs on wafers. Called the MiNY PL, the tool is designed to detect abnormalities in the LEDs’ external appearance, intensity, and wavelength of their light emissions. The MiNY PL system uses a photoluminescence (PL) measurement technique based on the company’s image processing technology and a newly developed imaging module.

According to Hamamatsu, the MiNY PL makes fast pass/fail decisions when inspecting microLEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D and production efficiency of microLEDs. Furthermore, the MiNY PL will also streamline the 100 percent inspection process of microLEDs in future mass production lines.